Advanced Analytical (Scanning) Transmission Electron Microscope ((S)TEM) optimised for structural and chemical characterisation of beam sensitive materials

The University of Manchester is looking to acquire an advanced analytical (scanning) transmission electron microscope ((S)TEM) optimised for structural and chemical characterisation of beam sensitive materials. Currently TEM is used extensively in the study of inorganic materials which often exhibit good thermal and electrical conductivity or highly stable bonding and structure, making them able to withstand the high energy density experienced in focussed electron beams and several hundred kilovolt acceleration. The development of new generation high sensitivity and high speed direct or hybrid detectors means that the energy dose can be reduced to the point where other types of materials, notably organic, hybrid organic-inorganic and pharmaceutical materials can be analysed in TEM.

With this capability we intend to extend the significant understanding and experience of microstructure-property relationships into the regime of these beam-sensitive materials.

To achieve this, the system must be able to perform scanning precession electron diffraction (SPED), which will be used for the microstructure analysis of materials. This needs to be operated through a direct electron detector or hybrid detector system (minimum 512x512 pixels) in order to achieve detection even at the low doses required for beam-sensitive materials. The ability to perform strain analysis is also required.

The TEM is also required to perform high-speed energy dispersive X-ray spectroscopy (EDS) experiments. There must be the ability to acquire and save both EDS and SPED measurements simultaneously. This combination of measurement methods will make the instrument unique in the world with regards to structure and composition analysis of a huge range of materials types.

Furthermore to improve the stability of many materials in the electron beam a cryogenic cooling holder capable of lowering samples to liquid nitrogen temperatures (~100K) is required and this will complement the wide range of other TEM sample holders available in the University of Manchester for in-situ experimentation.

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Delivery Notes

The University of Manchester is looking to acquire an advanced analytical (scanning) transmission electron microscope ((S)TEM) optimised for structural and chemical characterisation of beam sensitive materials. Currently TEM is used extensively in the study of inorganic materials which often exhibit good thermal and electrical conductivity or highly stable bonding and structure, making them able to withstand the high energy density experienced in focussed electron beams and several hundred kilovolt acceleration. The development of new generation high sensitivity and high speed direct or hybrid detectors means that the energy dose can be reduced to the point where other types of materials, notably organic, hybrid organic-inorganic and pharmaceutical materials can be analysed in TEM.

With this capability we intend to extend the significant understanding and experience of microstructure-property relationships into the regime of these beam-sensitive materials.

To achieve this, the system must be able to perform scanning precession electron diffraction (SPED), which will be used for the microstructure analysis of materials. This needs to be operated through a direct electron detector or hybrid detector system (minimum 512x512 pixels) in order to achieve detection even at the low doses required for beam-sensitive materials. The ability to perform strain analysis is also required.

The TEM is also required to perform high-speed energy dispersive X-ray spectroscopy (EDS) experiments. There must be the ability to acquire and save both EDS and SPED measurements simultaneously. This combination of measurement methods will make the instrument unique in the world with regards to structure and composition analysis of a huge range of materials types.

Furthermore to improve the stability of many materials in the electron beam a cryogenic cooling holder capable of lowering samples to liquid nitrogen temperatures (~100K) is required and this will complement the wide range of other TEM sample holders available in the University of Manchester for in-situ experimentation.

Funding Description

The University of Manchester is looking to acquire an advanced analytical (scanning) transmission electron microscope ((S)TEM) optimised for structural and chemical characterisation of beam sensitive materials. Currently TEM is used extensively in the study of inorganic materials which often exhibit good thermal and electrical conductivity or highly stable bonding and structure, making them able to withstand the high energy density experienced in focussed electron beams and several hundred kilovolt acceleration. The development of new generation high sensitivity and high speed direct or hybrid detectors means that the energy dose can be reduced to the point where other types of materials, notably organic, hybrid organic-inorganic and pharmaceutical materials can be analysed in TEM.

With this capability we intend to extend the significant understanding and experience of microstructure-property relationships into the regime of these beam-sensitive materials.

To achieve this, the system must be able to perform scanning precession electron diffraction (SPED), which will be used for the microstructure analysis of materials. This needs to be operated through a direct electron detector or hybrid detector system (minimum 512x512 pixels) in order to achieve detection even at the low doses required for beam-sensitive materials. The ability to perform strain analysis is also required.

The TEM is also required to perform high-speed energy dispersive X-ray spectroscopy (EDS) experiments. There must be the ability to acquire and save both EDS and SPED measurements simultaneously. This combination of measurement methods will make the instrument unique in the world with regards to structure and composition analysis of a huge range of materials types.

Is a Recurrent Procurement Type? : No